Joint Research Group of Analytical and X-Ray Microanalysis

Team head:

Marek Faryna, Ph.D.

Assistant Professor

Staff: 8

Team leaders:

Prof. Jan Dutkiewicz, Ph.D.

Marek Faryna, Ph.D.

The joint group consists of the Scanning and X-ray Microanalysis Division of the Regional Laboratory and the Analytical Transmission Electron Microscopy Division of the Institute of Metallurgy and Materials Science, Polish Academy of Sciences. The group runs experiments allowing to establish the chemical and phase composition of alloys, ceramics and composites in micro and nano as well as in macro scale.

Research topics:

electron microscopy applied to the ceramic composites based on tetragonal circonia polycrystals

phase transformations in shape memory alloys

evaluation of chemical composition fluctuations in HgCdTe solid solutions after laser annealing

Research equipment:

Scanning Electron Microscope Philips XL30 (Philips Electron Optics, Holland) equipped with Energy Dispersive Spectrometer LINK ISIS (Oxford Instruments, UK)

Analytical Transmission Electron Microscope Philips CM20 (Philips Electron Optics, Holland) equipped with Energy Dispersive Spectrometer LINK eXL (Oxford Instruments, UK)

Trasmission Electron Microscope Philips 301 (Philips Electron Optics, Holland)

Ion Thinning Machine Duo Mill GATAN 600

Radio Frequency Glow Discharge Optical Emission Spectrometer (Jobin Yvon Emission, France)

A wide range of specimen preparation facilities.

International collaboration:

Manchester Materials Science Centre, University of Manchester and UMIST, Grosvenor St., Manchester M1 7HS, UK (Prof. Gordon W. Lorimer)
University of California, 561 Evans Hall, Berkeley, CA 94720-1760, USA (Prof. Gareth Thomas)
Technical University of Berlin, Institute of Metallic Materials, Strasse des 17 Juni 135, 10623 Berlin, Germany (Prof. Winfried Reif)

Contact:

Institute of Metallurgy and Materials Engineering, ul. Reymonta 25, 30-059 Kraków, Poland;
Dr. Marek Faryna, tel.: (48-12) 637 42 00, ext. 202, 257 fax: (48-12) 637 21 92
Email: nmfaryna@imim-pan.krakow.pl

Selected publications:

M.Faryna, J.Lis, R.Kórnik, SEM Studies of Microstructural Development during Sintering of Ti₃SiC₂ - based Composites, Journal of Trace and Microanalysis Techniques 15(4), 1997, 459-465.
T.Ya.Gorbach, R.Yu.Holiney, L.A.Matveeva, P.S.Smertenko, S.V.Svechnikov, E.F.Venger, R.Ciach, M.Faryna, Growth of III-V semiconductor layers on Si patterned substrates, Thin Solids Films 336, 1998, 63-68.
A.Urbanik, M.Faryna, T.J.Popiela, K.Kleinrock, Angiography equipment: quality assessment using electron microscope and x-ray spectrometry, Supplement to Radiology, vol. 213 (P), 1999, 567.
M.Faryna, Microstructure of Tetragonal Zirconia Polycrystals Based Composites with Carbide Additives, Inzynieria Materialowa, 2 (115), 2000, 62-75.
M.Faryna, J.Jura, K.Sztwiertnia, Orientation Imaging Microscopy Applied of Zirconia Ceramics, Mikrochimica. Acta 132, 2000, 517-520.
K.Haberko, A.Wajler, Z.Pedzich, M.Faryna, M.M.Bucko, Surface Hardening of Ti,Y Zirconia, Key Engineering Materials Vols. 206-213, Trans Tech Publications, Switzerland, 2002, 393-397.

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